This year, four of our PhD students took part in the ECCE Europe conference in Birmingham.
With one presentation and three poster contributions, we showcased our latest research and project works in the fields of advanced modelling approaches for GaN HEMTs, novel packaging technolgies for GaN based power electronics, gate stress tests for SiC and machine learning based degradation state prediction of SiC MOSFETs .
A big thanks to everyone who participated and stopped by – we really appreciated the exchange, the interest, and the interesting discussions!
