This week our colleague Dominik Koch attended the 2026 IEEE Applied Power Electronics Conference and Exposition (APEC), where he presented research from ILH on the use of artificial intelligence and machine learning for characterization, modelling, and reliability testing of SiC and GaN power devices. The presentation, titled "AI-Driven Digital Twins for Design, Characterization and Reliability of GaN and SiC Power Devices and Systems", was part of a special industry session on "AI and Digital Twins Transforming Power Device Innovation", organized by PSMA, Stephanie Butler, Kevin Hermanns, and Jaume Roig.
Many thanks to all the attendees and to the contributors of this work Diego Kuderna-Melgar, Jeremy Nuzzo, Oleksandr Solomakha, Tobias Fink, Valentyna Afanasenko, and Ingmar Kallfass.
